The Radio-frequency single electron transistor (RF-SET) is the fastest and most sensitive electrometer known today. Many schemes proposed for sensitive measurement applications have invoked the promise of the RF-SET for fast and ultra-sensitive charge detection. These include Qubits based on nuclear spins in silicon, charged particle detectors, quantum nanomechanical oscillations and single terahertz photon counters. It is one of the only tools for detecting single electron charges at the nanometer scale and with gigahertz band-width.
In collaboration with the Chalmers and Yale groups, we have made theoretical analysis and experiments to estimate the charge sensitivity of a radio frequency single-electron transistor. The theoretical prediction is based on a model which includes equivalent circuits for all the components of the measurement system. Low-noise first-stage amplifier was integrated in the analysis and the noise power wave formalism was employed in the analysis of the aluminum single-electron transistor test system.
- Noise performance of the radio-frequency single-electron transistor
L. Roschier, P.J. Hakonen, K. Bladh, P. Delsing, K.W. Lehnert, L. Spietz, and R.J. Schoelkopf
J. Appl. Phys. 95, 1274 (2004)